Semiconductor - application notes

 

  • RA39 : Strain measurements of a Si cap layer deposited on a SiGe substrate determination of Ge content.
  • Semiconductor02 : Strained Si for Sub-100nm MOSFETs.
  • Semiconductor03 : Raman Spectroscopy: About Chips and Stress.
  • RA42 : Raman Imaging of a Single Gallium Nitride Nanowire.

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Articles

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